Table of contents

The course is connected to the following study programs

Teaching language

English

Recommended previous knowledge

Master in materials science/technology, chemistry, solid state physics, or another discipline closely related to materials science.

Learning outcomes

On completing the course, the student will be able to:

  • describe methodology, capabilities and limitations of microscopy techniques (light optical microscopy (LOM), scanning electron microscopy (SEM), and scanning probe microscopy (SPM) and their application at single/multiphase materials in macro- and nanoscale.
  • identify suitable methods to analyse different material properties on micro- and nanoscale.
  • analyse powder x-ray diffraction patterns based on available databases (qualitative and quantitative analysis).
  • analyse thermophysical and kinetic property data as function of temperature and/or time.
  • run typical experiments on powder x-ray diffraction, scanning electron microscope (SEM) and thermal analysis.
  • decide/select/combine various complementary techniques depending on case demonstrations.

Contents

The course is designed to develop an understanding of materials characterization techniques used in materials science and electro-chemistry, i.e.

(i) microscopic techniques: optical and electron microscopy,(ii) diffraction techniques: powder x-ray, and(iii) thermal techniques: thermal gravimetric analysis (TA) and differential scanning calorimetry (DSC), as well as sample preparation, result analysis and interpretation, and reporting.The course includes demonstrations and/or lab experiments of chosen experimental methods.

Teaching and learning methods

The teaching will be a combination of lectures, tutorials, laboratory exercises and self-study. The course is primary intended for Doctoral degree students at the Department of Engineering Sciences. However, external students may be accepted into the course after careful evaluation. Lectures will be given partly in person and on-line. The students can expect to work about 40 hours in the laboratories and 50 hours self-study.

Examination requirements

To be allowed to attend the exam, the assignments must have been approved.

Examinations

Oral examination. Pass/Fail.

Student evaluation

The course will be evaluated in accordance with the quality assurance system for education, chapter 4.1.

Offered as a free-standing course

Yes. Subject to availability or capacity.

Admission Requirement if given as a free-standing course

Must be admitted to a PhD programme.

Admission for external candidates

No.

Other information

Resources

Excerpts from

  • Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Yang Leng, Wiley-VCH, 2nd edition, 2013 (ISBN: 9783527670772).
  • Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008 (ISBN: 9781420042948).
  • ASM Handbook, Prepared under the Direction of the ASM International Handbook Committee, Vol 10, Materials Characterization, 1991 (ISBN: 978-0-87170-016-2).
  • Elements of X-ray Diffraction, Bernard D. Cullity, Stuart R. Stock, Pearson, 3rd edition 2001 (ISBN: 978-0201610918).
  • Selected journal articles.
  • Equipment: Light Optical Microscope (LOM), Scanning Electron Microscope (SEM), Thermal gravimetric analyser (TA), Differential scanning calorimetry (DSC)
Last updated from FS (Felles studentsystem) Oct. 15, 2026 2:07:57 PM